Supermirror fabrication via electroforming

Melville P. Ulmer, Robert I. Altkorn, Allen S. Krieger, Daniel R. Parsignault, Yip Wah Chung, M. S. Wong, Barry P. Lai, Derrick C. Mancini, Peter Z. Takacs, Eugene L. Church

Research output: Contribution to journalConference articlepeer-review

Abstract

As part of a project to develop methods of placing highly reflective multilayer coatings on the inside of Wolter I mirrors, we have been pursuing a program of measuring flat mirrors. These flats have been produced and examined at various stages of the process we plan to use to fabricate multilayer coated Wolter I mirrors. The flats were measured via optical profiler, AFM, (both done at Brookhaven National Lab) and X-ray reflection (done at the Argonne National Lab Advanced Photon Source). We report for the first time, to our knowledge, the successful placement of multilayers on an electroform by depositing the multilayers on a master and then electroforming onto this master and removing the multilayers, intact, on the electroform. This process is the one we plan to use to place multilayers on the inside of Wolter I optics.

Original languageEnglish (US)
Pages (from-to)240-249
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3152
DOIs
StatePublished - 1997
EventMaterials, Manufacturing, and Measurement for Synchrotron Radiation Mirrors - San Diego, CA, United States
Duration: Jul 30 1997Jul 30 1997

Keywords

  • AFM
  • Multilayers
  • Profiler
  • Wolter I
  • X rays

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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