Surface crystallography via electron microscopy

A. Subramanian*, L. D. Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations


The study of atomic structure of surfaces is fundamental to the understanding of electronic, chemical and mechanical properties of surfaces and numerous techniques have been developed to this end. Transmission Electron Microscopy techniques, namely transmission electron imaging (TEM) and diffraction (TED), due to their ability to provide structural information at very high resolutions, have emerged as powerful tools for the study of surface structure. In this article we review the experimental method alongside the various post-processing routines that are necessary to extract vital structural information from experimental data.

Original languageEnglish (US)
Pages (from-to)151-157
Number of pages7
Issue number2-4
StatePublished - Jan 2004


  • 001,006,027,041
  • 07.05.Pj
  • 61.14.Lj
  • 68.35.Bs
  • 68.37.Lp
  • Computer simulations
  • Direct methods
  • Electron diffraction
  • Image processing
  • Surface relaxation and reconstruction
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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