Surface crystallography via electron microscopy

A. Subramanian; L. D. Marks

doi:10.1016/j.ultramic.2003.08.008

Surface crystallography via electron microscopy

A. Subramanian^*, L. D. Marks

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

The study of atomic structure of surfaces is fundamental to the understanding of electronic, chemical and mechanical properties of surfaces and numerous techniques have been developed to this end. Transmission Electron Microscopy techniques, namely transmission electron imaging (TEM) and diffraction (TED), due to their ability to provide structural information at very high resolutions, have emerged as powerful tools for the study of surface structure. In this article we review the experimental method alongside the various post-processing routines that are necessary to extract vital structural information from experimental data.

Original language	English (US)
Pages (from-to)	151-157
Number of pages	7
Journal	Ultramicroscopy
Volume	98
Issue number	2-4
DOIs	https://doi.org/10.1016/j.ultramic.2003.08.008
State	Published - Jan 2004

Funding

This research was supported by the National Science Foundation grant number DMR-007-5834.

Keywords

001,006,027,041
07.05.Pj
61.14.Lj
68.35.Bs
68.37.Lp
Computer simulations
Direct methods
Electron diffraction
Image processing
Surface relaxation and reconstruction
Transmission electron microscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1016/j.ultramic.2003.08.008

Cite this

@article{9fd28c5facc94497b4273c16b36dd85a,

title = "Surface crystallography via electron microscopy",

abstract = "The study of atomic structure of surfaces is fundamental to the understanding of electronic, chemical and mechanical properties of surfaces and numerous techniques have been developed to this end. Transmission Electron Microscopy techniques, namely transmission electron imaging (TEM) and diffraction (TED), due to their ability to provide structural information at very high resolutions, have emerged as powerful tools for the study of surface structure. In this article we review the experimental method alongside the various post-processing routines that are necessary to extract vital structural information from experimental data.",

keywords = "001,006,027,041, 07.05.Pj, 61.14.Lj, 68.35.Bs, 68.37.Lp, Computer simulations, Direct methods, Electron diffraction, Image processing, Surface relaxation and reconstruction, Transmission electron microscopy",

author = "A. Subramanian and Marks, {L. D.}",

year = "2004",

month = jan,

doi = "10.1016/j.ultramic.2003.08.008",

language = "English (US)",

volume = "98",

pages = "151--157",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

number = "2-4",

}

TY - JOUR

T1 - Surface crystallography via electron microscopy

AU - Subramanian, A.

AU - Marks, L. D.

PY - 2004/1

Y1 - 2004/1

N2 - The study of atomic structure of surfaces is fundamental to the understanding of electronic, chemical and mechanical properties of surfaces and numerous techniques have been developed to this end. Transmission Electron Microscopy techniques, namely transmission electron imaging (TEM) and diffraction (TED), due to their ability to provide structural information at very high resolutions, have emerged as powerful tools for the study of surface structure. In this article we review the experimental method alongside the various post-processing routines that are necessary to extract vital structural information from experimental data.

AB - The study of atomic structure of surfaces is fundamental to the understanding of electronic, chemical and mechanical properties of surfaces and numerous techniques have been developed to this end. Transmission Electron Microscopy techniques, namely transmission electron imaging (TEM) and diffraction (TED), due to their ability to provide structural information at very high resolutions, have emerged as powerful tools for the study of surface structure. In this article we review the experimental method alongside the various post-processing routines that are necessary to extract vital structural information from experimental data.

KW - 001,006,027,041

KW - 07.05.Pj

KW - 61.14.Lj

KW - 68.35.Bs

KW - 68.37.Lp

KW - Computer simulations

KW - Direct methods

KW - Electron diffraction

KW - Image processing

KW - Surface relaxation and reconstruction

KW - Transmission electron microscopy

UR - http://www.scopus.com/inward/record.url?scp=1842577696&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1842577696&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2003.08.008

DO - 10.1016/j.ultramic.2003.08.008

M3 - Article

C2 - 15046794

AN - SCOPUS:1842577696

SN - 0304-3991

VL - 98

SP - 151

EP - 157

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 2-4

ER -

Surface crystallography via electron microscopy

Abstract

Funding

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this