Surface enhanced Raman spectroscopy: A minimally invasive tool to assist in authentication and interpretation of works of art on paper

F. Casadio*, C. L. Brosseau, Richard P Van Duyne

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationXXII International Conference on Raman Spectroscopy, ICORS 2010
Pages141-142
Number of pages2
Volume1267
DOIs
StatePublished - Dec 14 2010
Event22nd International Conference on Raman Spectroscopy, ICORS 2010 - Boston, MA, United States
Duration: Aug 8 2010Aug 13 2010

Other

Other22nd International Conference on Raman Spectroscopy, ICORS 2010
CountryUnited States
CityBoston, MA
Period8/8/108/13/10

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this