Surface properties of the refractory metal-nitride semiconductor ScN: Screened-exchange LDA-FLAPW investigations

C. Stampfl*, R. Asahi, A. J. Freeman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

47 Scopus citations

Abstract

Density-functional theory calculations employing the screened-exchange local-density approximation (SX-LDA) with the full potential linearized augmented plane-wave method have recently shown that the relatively unexplored refractory nitrides ScN, YN, and LaN are semiconductors. For the ScN(001) surface, the present calculations predict that the ideal-relaxed surface has the lowest formation energy for most of the range of the allowed chemical potentials - and is semiconducting - while N-deficient structures, which are predicted to form for Sc-rich conditions, are metallic in nature. Compared to the LDA surface-state band structures, the SX-LDA selectively pushes down the valence bands for the Sc-terminated surface and pushes up the conduction bands for the N-terminated structure.

Original languageEnglish (US)
Article number161204
Pages (from-to)1612041-1612044
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume65
Issue number16
StatePublished - Apr 15 2002

ASJC Scopus subject areas

  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Surface properties of the refractory metal-nitride semiconductor ScN: Screened-exchange LDA-FLAPW investigations'. Together they form a unique fingerprint.

Cite this