Surface science applied to lasers: near-field optical microscpoy

S. K. Buratto*, J. W. Hsu, Lisa Dhar, R. B. Byslma, C. C. Bahr, Mark J. Cardillo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Near-field scattering optical microscopy (NSOM) is used to characterize the emission output and to obtain photoconductivity maps of InGaAsP multiple quantum well lasers. The high spatial resolution of NSOM (approximately λ/20) allows detailed imaging of the laser structure. Emission measurements not only provide direct visualization of the laser mode but also reveal unwanted emission due to InP electroluminescence. Near-field photoconductivity experiments yield high resolution measurement of carrier transport throughout the structure yielding valuable information on current leakage, defect formation, and the quality of p-n junctions.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages279-284
Number of pages6
StatePublished - 1995
Externally publishedYes
EventLaser Techniques for Surface Science II - San Diego, CA, USA
Duration: Jul 12 1995Jul 14 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2547
ISSN (Print)0277-786X

Other

OtherLaser Techniques for Surface Science II
CitySan Diego, CA, USA
Period7/12/957/14/95

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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