TY - JOUR
T1 - Synthesis and thermoelectric properties of (Cuy Mo6 Se8)1 - x (Mo4 Ru2 Se8)x alloys
AU - Schmidt, Anneliese M.
AU - McGuire, Michael A.
AU - Gascoin, Franck
AU - Snyder, G. Jeffrey
AU - DiSalvo, Francis J.
N1 - Funding Information:
This paper was expanded from part of a Master’s Thesis presented to Cornell University by A.M. Schmidt in August 2005. The work was funded by NASA/JPL. We thank John Sinnot for help with sample mounting and polishing, and John Hunt for assistance with the microprobe analysis. The microprobe and polishing equipment are part of the Cornell Center for Materials Research, which is supported by a MRSEC Grant (DMR-0520404). Portions of this work were carried out by the Jet Propulsion Laboratory, California Institute of Technology, under contract with NASA.
PY - 2007/4/4
Y1 - 2007/4/4
N2 - The Chevrel phase solid solutions (Cuy Mo6 Se8)1 - x (Mo4 Ru2 Se8)x, with nominal y = 2, 4 and x = 0, 0.2, 0.4, 0.6, 0.8, and 1.0 have been investigated in efforts to find improved high temperature thermoelectric materials. The samples were characterized by powder X-ray diffraction, and compositions were measured using quantitative electron microprobe analysis. The resistivity and Seebeck coefficient are reported from room temperature up to approximately 1100 K. From these measurements we estimate the thermoelectric figure of merit ZT, and the most promising compound had Z T ≈ 0.37 at 1000 K.
AB - The Chevrel phase solid solutions (Cuy Mo6 Se8)1 - x (Mo4 Ru2 Se8)x, with nominal y = 2, 4 and x = 0, 0.2, 0.4, 0.6, 0.8, and 1.0 have been investigated in efforts to find improved high temperature thermoelectric materials. The samples were characterized by powder X-ray diffraction, and compositions were measured using quantitative electron microprobe analysis. The resistivity and Seebeck coefficient are reported from room temperature up to approximately 1100 K. From these measurements we estimate the thermoelectric figure of merit ZT, and the most promising compound had Z T ≈ 0.37 at 1000 K.
KW - Electronic transport
KW - Semiconductors
KW - X-ray diffraction
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U2 - 10.1016/j.jallcom.2006.05.061
DO - 10.1016/j.jallcom.2006.05.061
M3 - Article
AN - SCOPUS:33847287340
SN - 0925-8388
VL - 431
SP - 262
EP - 268
JO - Journal of Alloys and Compounds
JF - Journal of Alloys and Compounds
IS - 1-2
ER -