TY - GEN
T1 - Synthesis of resilient circuits from guarded atomic actions
AU - Chen, Yuankai
AU - Zhou, Hai
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/3/11
Y1 - 2015/3/11
N2 - With aggressive scaling of minimum feature sizes, supply voltages, and design guard-bands, transient faults have become critical issues in modern electronic circuits. Synthesis from guarded atomic actions has been investigated by Arvind et al. to explore non-determinism for hardware concurrency. We show in this work that non-determinism in the guarded atomic actions can be further explored for synthesis of resilient circuits. When an error happens in an atomic action, the action may not need to be recomputed if there exist other feasible actions. Such flexibilities will be increased in the specification and explored in the synthesis for efficient error resiliency. Our synthesis approach expands the solution space and offers the possibility of performance optimization. Experimental results demonstrate the effectiveness and efficiency of our synthesis approach.
AB - With aggressive scaling of minimum feature sizes, supply voltages, and design guard-bands, transient faults have become critical issues in modern electronic circuits. Synthesis from guarded atomic actions has been investigated by Arvind et al. to explore non-determinism for hardware concurrency. We show in this work that non-determinism in the guarded atomic actions can be further explored for synthesis of resilient circuits. When an error happens in an atomic action, the action may not need to be recomputed if there exist other feasible actions. Such flexibilities will be increased in the specification and explored in the synthesis for efficient error resiliency. Our synthesis approach expands the solution space and offers the possibility of performance optimization. Experimental results demonstrate the effectiveness and efficiency of our synthesis approach.
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U2 - 10.1109/ASPDAC.2015.7059064
DO - 10.1109/ASPDAC.2015.7059064
M3 - Conference contribution
AN - SCOPUS:84926486733
T3 - 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015
SP - 550
EP - 555
BT - 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015
Y2 - 19 January 2015 through 22 January 2015
ER -