Abstract
We present an analysis of systematic errors in an apparatus for measuring linear polarization in far-infrared observations of astrophysical objects. In particular, we examine a systematic effect which has until now limited the accuracy of measurement of spatially extended sources. We describe modifications to the apparatus which have reduced the effect to almost negligible levels.
Original language | English (US) |
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Pages (from-to) | 1000-1006 |
Number of pages | 7 |
Journal | Applied optics |
Volume | 28 |
Issue number | 5 |
DOIs | |
State | Published - Mar 1989 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering