Technique for measuring time-dependent optical nonlinearities using continuous time-resolved Z-scan

David O. Caplan*, Gregory Scott Kanter, Prem Kumar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A dual-beam (pulsed-pump, cw-probe) Z-scan technique (CWZ-scan) can simultaneously measure both fast and slow nonlinear mechanisms contributing to the nonlinear refractive index by recording cw-probe transmission, T(z,t), as a function of both time and z position. A similar approach was previously used as a sensitive measure of slow thermal variations in refractive index. This paper expand upon this work by demonstrating that CWZ-scan can be used to completely determine the nonlinear components of refraction n(I, t) and absorption α(I, t) as functions of intensity and time. This is accomplished by fitting the experimental transmission surface T(z, t) to the theory, which was simulated following the approach of Lee et.al. that includes effects of bound-electronic (Kerr) refraction, two-photon absorption (TPA), and free-carrier refraction (FCR) absorption (FCA), and recombination.

Original languageEnglish (US)
Pages (from-to)14-15
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
StatePublished - Jan 1 1996

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering

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