TEM analysis and fabrication of magnetic nanoparticles

T. J. Bromwich*, D. G. Bucknall, B. Warot, A. K. Petford-Long, C. A. Ross

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

Arrays of magnetic pillars 175 nm tall and 75 nm in diameter have been analyzed using Foucault mode Lorentz TEM. This paper describes a sample preparation route for TEM cross sections and shows that even in such small pillars sufficient magnetic contrast is visible to reveal the reversal of magnetisation in the pillars after application of a 2 kOe field. The reversal mechanism is shown to be incoherent by micromagnetic modelling.

Original languageEnglish (US)
Pages (from-to)95-98
Number of pages4
JournalInstitute of Physics Conference Series
Volume179
StatePublished - 2004
EventElectron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford, United Kingdom
Duration: Sep 3 2003Sep 5 2003

ASJC Scopus subject areas

  • General Physics and Astronomy

Fingerprint

Dive into the research topics of 'TEM analysis and fabrication of magnetic nanoparticles'. Together they form a unique fingerprint.

Cite this