TEM analysis of multivalent ion battery cathode

K. C. Bilash; Jinglong Guo; Robert Klie; D. Bruce Buchholz; Guennadi Evmenenko; Jaejin Kim; Timothy Fister; Brian Ingram

doi:10.1017/S1431927620024058

TEM analysis of multivalent ion battery cathode

K. C. Bilash, Jinglong Guo, Robert Klie, D. Bruce Buchholz, Guennadi Evmenenko, Jaejin Kim, Timothy Fister, Brian Ingram

MRC - Materials Research Center

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S1431927620024058
State	Accepted/In press - 2020

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927620024058

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@article{542058acd8d24c72a2f35b83d5d10d7c,

title = "TEM analysis of multivalent ion battery cathode",

author = "Bilash, {K. C.} and Jinglong Guo and Robert Klie and {Bruce Buchholz}, D. and Guennadi Evmenenko and Jaejin Kim and Timothy Fister and Brian Ingram",

year = "2020",

doi = "10.1017/S1431927620024058",

language = "English (US)",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - TEM analysis of multivalent ion battery cathode

AU - Bilash, K. C.

AU - Guo, Jinglong

AU - Klie, Robert

AU - Bruce Buchholz, D.

AU - Evmenenko, Guennadi

AU - Kim, Jaejin

AU - Fister, Timothy

AU - Ingram, Brian

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?scp=85214066896&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85214066896&partnerID=8YFLogxK

U2 - 10.1017/S1431927620024058

DO - 10.1017/S1431927620024058

M3 - Comment/debate

AN - SCOPUS:85214066896

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

TEM analysis of multivalent ion battery cathode

ASJC Scopus subject areas

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