Temperature dependence of surface layering in a dielectric liquid

Haiding Mo*, Sumit Kewalramani, Guennadi Evmenenko, Kyungil Kim, Steven N. Ehrlich, Pulak Dutta

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The temperature dependence of the density oscillations (layers) at the free surface of tetrakis(2-ethylhexoxy)silane, a nonmetallic molecular liquid, was investigated using x-ray reflectivity. Below ∼215 K, the layer parameters weakly vary with temperature, if at all. Above this temperature, the layer spacings and intrinsic layer widths increase continuously, until there is no identifiable layering above 230 K. This transition occurs at T Tc 0.23, a temperature region that is usually accessible in metallic liquids but is preempted by freezing in many dielectric liquids.

Original languageEnglish (US)
Article number024206
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume76
Issue number2
DOIs
StatePublished - Jul 24 2007

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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