TY - JOUR
T1 - Temperature dependence of surface layering in a dielectric liquid
AU - Mo, Haiding
AU - Kewalramani, Sumit
AU - Evmenenko, Guennadi
AU - Kim, Kyungil
AU - Ehrlich, Steven N.
AU - Dutta, Pulak
PY - 2007/7/24
Y1 - 2007/7/24
N2 - The temperature dependence of the density oscillations (layers) at the free surface of tetrakis(2-ethylhexoxy)silane, a nonmetallic molecular liquid, was investigated using x-ray reflectivity. Below ∼215 K, the layer parameters weakly vary with temperature, if at all. Above this temperature, the layer spacings and intrinsic layer widths increase continuously, until there is no identifiable layering above 230 K. This transition occurs at T Tc 0.23, a temperature region that is usually accessible in metallic liquids but is preempted by freezing in many dielectric liquids.
AB - The temperature dependence of the density oscillations (layers) at the free surface of tetrakis(2-ethylhexoxy)silane, a nonmetallic molecular liquid, was investigated using x-ray reflectivity. Below ∼215 K, the layer parameters weakly vary with temperature, if at all. Above this temperature, the layer spacings and intrinsic layer widths increase continuously, until there is no identifiable layering above 230 K. This transition occurs at T Tc 0.23, a temperature region that is usually accessible in metallic liquids but is preempted by freezing in many dielectric liquids.
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U2 - 10.1103/PhysRevB.76.024206
DO - 10.1103/PhysRevB.76.024206
M3 - Article
AN - SCOPUS:34547128371
SN - 1098-0121
VL - 76
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 2
M1 - 024206
ER -