Temperature dependent resistance of exchange biased spin valves with extremely thin IrMn

Nathaniel P. Stern; Ariel E. Barton; Patricia D. Sparks; Matthew J. Carey; James C. Eckert

Temperature dependent resistance of exchange biased spin valves with extremely thin IrMn

Nathaniel P. Stern^*, Ariel E. Barton, Patricia D. Sparks, Matthew J. Carey, James C. Eckert

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

Abstract

The temperature dependent resistance of exchange biased spin valves with extremely thin IrMn was investigated. It was found that the magnitude of the difference between the resistance extrema depended upon the aspect ratio of the sample. The results showed that the temperatures at which the maxima and minima occur depended on the thickness of the IrMn layer.

Original language	English (US)
Journal	Digests of the Intermag Conference
State	Published - Dec 1 2002
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{21b9eff9172a429ab021498c4524858d,

title = "Temperature dependent resistance of exchange biased spin valves with extremely thin IrMn",

abstract = "The temperature dependent resistance of exchange biased spin valves with extremely thin IrMn was investigated. It was found that the magnitude of the difference between the resistance extrema depended upon the aspect ratio of the sample. The results showed that the temperatures at which the maxima and minima occur depended on the thickness of the IrMn layer.",

author = "Stern, {Nathaniel P.} and Barton, {Ariel E.} and Sparks, {Patricia D.} and Carey, {Matthew J.} and Eckert, {James C.}",

year = "2002",

month = dec,

day = "1",

language = "English (US)",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

}

TY - JOUR

T1 - Temperature dependent resistance of exchange biased spin valves with extremely thin IrMn

AU - Stern, Nathaniel P.

AU - Barton, Ariel E.

AU - Sparks, Patricia D.

AU - Carey, Matthew J.

AU - Eckert, James C.

PY - 2002/12/1

Y1 - 2002/12/1

N2 - The temperature dependent resistance of exchange biased spin valves with extremely thin IrMn was investigated. It was found that the magnitude of the difference between the resistance extrema depended upon the aspect ratio of the sample. The results showed that the temperatures at which the maxima and minima occur depended on the thickness of the IrMn layer.

AB - The temperature dependent resistance of exchange biased spin valves with extremely thin IrMn was investigated. It was found that the magnitude of the difference between the resistance extrema depended upon the aspect ratio of the sample. The results showed that the temperatures at which the maxima and minima occur depended on the thickness of the IrMn layer.

UR - http://www.scopus.com/inward/record.url?scp=18244430580&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=18244430580&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:18244430580

SN - 0074-6843

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

ER -

Temperature dependent resistance of exchange biased spin valves with extremely thin IrMn

Abstract

ASJC Scopus subject areas

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