The temperature dependent resistance of exchange biased spin valves with extremely thin IrMn was investigated. It was found that the magnitude of the difference between the resistance extrema depended upon the aspect ratio of the sample. The results showed that the temperatures at which the maxima and minima occur depended on the thickness of the IrMn layer.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - Dec 1 2002|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: Apr 28 2002 → May 2 2002
ASJC Scopus subject areas
- Electrical and Electronic Engineering