Abstract
Three-dimensional atom probe analysis to giant magnetoresistance (GMR) materials was discussed. Interdiffison or interface segregation at the atomic level were studied. It was found that this technique is capable of characterizing internal interfaces with sub-nanometer-scale topological features.
Original language | English (US) |
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Journal | Digests of the Intermag Conference |
State | Published - Oct 1 2003 |
Event | Intermag 2003: International Magnetics Conference - Boston, MA, United States Duration: Mar 28 2003 → Apr 3 2003 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering