The application of three-dimensional atom probe analysis to GMR materials

A. K. Petford-Long, D. J. Larson, A. Cerezo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We discuss the giant magnetoresistance (GMR) property of CoFe/Cu magnetic multilayers. TEM images of the Co/Pt multilayer film show the crystal structure in the layers.

Original languageEnglish (US)
Title of host publicationIntermag 2003 - Program of the 2003 IEEE International Magnetics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780376471, 9780780376472
DOIs
StatePublished - Jan 1 2003
Event2003 IEEE International Magnetics Conference, Intermag 2003 - Boston, United States
Duration: Mar 30 2003Apr 3 2003

Publication series

NameIntermag 2003 - Program of the 2003 IEEE International Magnetics Conference

Other

Other2003 IEEE International Magnetics Conference, Intermag 2003
Country/TerritoryUnited States
CityBoston
Period3/30/034/3/03

Keywords

  • Atomic layer deposition
  • Atomic measurements
  • Drives
  • Giant magnetoresistance
  • Magnetic materials
  • Microscopy
  • Needles
  • Nonhomogeneous media
  • Probes
  • Transistors

ASJC Scopus subject areas

  • Engineering(all)

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