The application of three-dimensional atom probe analysis to GMR materials

A. K. Petford-Long; D. J. Larson; A. Cerezo

doi:10.1109/INTMAG.2003.1230437

The application of three-dimensional atom probe analysis to GMR materials

A. K. Petford-Long, D. J. Larson, A. Cerezo

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We discuss the giant magnetoresistance (GMR) property of CoFe/Cu magnetic multilayers. TEM images of the Co/Pt multilayer film show the crystal structure in the layers.

Original language	English (US)
Title of host publication	Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780376471, 9780780376472
DOIs	https://doi.org/10.1109/INTMAG.2003.1230437
State	Published - Jan 1 2003
Event	2003 IEEE International Magnetics Conference, Intermag 2003 - Boston, United States Duration: Mar 30 2003 → Apr 3 2003

Publication series

Name	Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

Other

Other	2003 IEEE International Magnetics Conference, Intermag 2003
Country/Territory	United States
City	Boston
Period	3/30/03 → 4/3/03

Keywords

Atomic layer deposition
Atomic measurements
Drives
Giant magnetoresistance
Magnetic materials
Microscopy
Needles
Nonhomogeneous media
Probes
Transistors

ASJC Scopus subject areas

General Engineering

Access to Document

10.1109/INTMAG.2003.1230437

Cite this

Petford-Long, A. K., Larson, D. J., & Cerezo, A. (2003). The application of three-dimensional atom probe analysis to GMR materials. In Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference Article 1230437 (Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2003.1230437

@inproceedings{6d377844fc80405384ac10d5b2e2bdd9,

title = "The application of three-dimensional atom probe analysis to GMR materials",

abstract = "We discuss the giant magnetoresistance (GMR) property of CoFe/Cu magnetic multilayers. TEM images of the Co/Pt multilayer film show the crystal structure in the layers.",

keywords = "Atomic layer deposition, Atomic measurements, Drives, Giant magnetoresistance, Magnetic materials, Microscopy, Needles, Nonhomogeneous media, Probes, Transistors",

author = "Petford-Long, {A. K.} and Larson, {D. J.} and A. Cerezo",

year = "2003",

month = jan,

day = "1",

doi = "10.1109/INTMAG.2003.1230437",

language = "English (US)",

series = "Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference",

address = "United States",

note = "2003 IEEE International Magnetics Conference, Intermag 2003 ; Conference date: 30-03-2003 Through 03-04-2003",

}

Petford-Long, AK, Larson, DJ & Cerezo, A 2003, The application of three-dimensional atom probe analysis to GMR materials. in Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference., 1230437, Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2003 IEEE International Magnetics Conference, Intermag 2003, Boston, United States, 3/30/03. https://doi.org/10.1109/INTMAG.2003.1230437

The application of three-dimensional atom probe analysis to GMR materials. / Petford-Long, A. K.; Larson, D. J.; Cerezo, A.
Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc., 2003. 1230437 (Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - The application of three-dimensional atom probe analysis to GMR materials

AU - Petford-Long, A. K.

AU - Larson, D. J.

AU - Cerezo, A.

PY - 2003/1/1

Y1 - 2003/1/1

N2 - We discuss the giant magnetoresistance (GMR) property of CoFe/Cu magnetic multilayers. TEM images of the Co/Pt multilayer film show the crystal structure in the layers.

AB - We discuss the giant magnetoresistance (GMR) property of CoFe/Cu magnetic multilayers. TEM images of the Co/Pt multilayer film show the crystal structure in the layers.

KW - Atomic layer deposition

KW - Atomic measurements

KW - Drives

KW - Giant magnetoresistance

KW - Magnetic materials

KW - Microscopy

KW - Needles

KW - Nonhomogeneous media

KW - Probes

KW - Transistors

UR - http://www.scopus.com/inward/record.url?scp=84949523451&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84949523451&partnerID=8YFLogxK

U2 - 10.1109/INTMAG.2003.1230437

DO - 10.1109/INTMAG.2003.1230437

M3 - Conference contribution

AN - SCOPUS:84949523451

T3 - Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

BT - Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2003 IEEE International Magnetics Conference, Intermag 2003

Y2 - 30 March 2003 through 3 April 2003

ER -

Petford-Long AK, Larson DJ, Cerezo A. The application of three-dimensional atom probe analysis to GMR materials. In Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2003. 1230437. (Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference). doi: 10.1109/INTMAG.2003.1230437

The application of three-dimensional atom probe analysis to GMR materials

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this