Abstract
The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.
Original language | English (US) |
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Pages (from-to) | 61-75 |
Number of pages | 15 |
Journal | Interface Science |
Volume | 1 |
Issue number | 1 |
DOIs | |
State | Published - Mar 1993 |
Keywords
- Cu/MgO heterophase interface
- Metal/ceramic interface
- atom-probe field-ion microscopy
- high resolution electron microscopy
- internal oxidation
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Condensed Matter Physics