Abstract
The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 61-75 |
| Number of pages | 15 |
| Journal | Interface Science |
| Volume | 1 |
| Issue number | 1 |
| DOIs | |
| State | Published - Mar 1 1993 |
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Keywords
- Cu/MgO heterophase interface
- Metal/ceramic interface
- atom-probe field-ion microscopy
- high resolution electron microscopy
- internal oxidation
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Condensed Matter Physics
Cite this
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The chemical composition of a metal/ceramic interface on an atomic scale : The Cu/MgO {111} interface. / Jang, H.; Seidman, David N; Merkle, K. L.
In: Interface Science, Vol. 1, No. 1, 01.03.1993, p. 61-75.Research output: Contribution to journal › Article
TY - JOUR
T1 - The chemical composition of a metal/ceramic interface on an atomic scale
T2 - The Cu/MgO {111} interface
AU - Jang, H.
AU - Seidman, David N
AU - Merkle, K. L.
PY - 1993/3/1
Y1 - 1993/3/1
N2 - The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.
AB - The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.
KW - Cu/MgO heterophase interface
KW - Metal/ceramic interface
KW - atom-probe field-ion microscopy
KW - high resolution electron microscopy
KW - internal oxidation
UR - http://www.scopus.com/inward/record.url?scp=0002326103&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0002326103&partnerID=8YFLogxK
U2 - 10.1007/BF00203266
DO - 10.1007/BF00203266
M3 - Article
AN - SCOPUS:0002326103
VL - 1
SP - 61
EP - 75
JO - Journal of Materials Science
JF - Journal of Materials Science
SN - 0022-2461
IS - 1
ER -