Abstract
For many random walks on "sufficiently large" finite groups the so-called cut-off phenomenon occurs: roughly stated, there exists a number k0, depending on the size of the group, such that k0 steps are necessary and sufficient for the random walk to closely approximate uniformity. As a first example on a continuous group, Rosenthal recently proved the occurrence of this cut-off phenomenon for a specific random walk on SO(N). Here we present and [for the case of O(N)] prove results for random walks on O(N), U(N) and Sp(N), where the one-step distribution is a suitable probability measure concentrated on reflections. In all three cases the cut-off phenomenon occurs at k0 = 1/2N log N.
Original language | English (US) |
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Pages (from-to) | 74-96 |
Number of pages | 23 |
Journal | Annals of Probability |
Volume | 24 |
Issue number | 1 |
DOIs | |
State | Published - 1996 |
Keywords
- Cut-off phenomenon
- Fourier analysis
- Random walk
- Reflection
ASJC Scopus subject areas
- Statistics and Probability
- Statistics, Probability and Uncertainty