The dynamic T2 chart for monitoring feedback-controlled processes

F. Tsung, D. W. Apley

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an effective implementation scheme is still lacking. This research provides a monitoring method, termed the dynamic T2 chart that improves the detection of assignable causes in feedback-controlled processes.

Original languageEnglish (US)
Pages (from-to)1043-1053
Number of pages11
JournalIIE Transactions (Institute of Industrial Engineers)
Volume34
Issue number12
DOIs
StatePublished - Jan 1 2002

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

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