Abstract
As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an effective implementation scheme is still lacking. This research provides a monitoring method, termed the dynamic T2 chart that improves the detection of assignable causes in feedback-controlled processes.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1043-1053 |
| Number of pages | 11 |
| Journal | IIE Transactions (Institute of Industrial Engineers) |
| Volume | 34 |
| Issue number | 12 |
| DOIs | |
| State | Published - Jan 1 2002 |
Funding
The authors are grateful to the anonymous referees and the department editor, Dr. Kwei Tang, for their valuable comments. F. Tsung's work was supported by RGC Competitive Earmarked Research Grant HKUST6073j OOE. The work of D. Apley was supported by the State of Texas Advanced Technology Program under grant number 000512-0289-1999 and the National Science Foundation under grant DMI-0093580.
ASJC Scopus subject areas
- Industrial and Manufacturing Engineering