TY - JOUR
T1 - The dynamic T2 chart for monitoring feedback-controlled processes
AU - Tsung, Fugee
AU - Apley, Daniel W.
PY - 2002/12
Y1 - 2002/12
N2 - As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an effective implementation scheme is still lacking. This research provides a monitoring method, termed the dynamic T1 chart that improves the detection of assignable causes in feedback-controlled processes.
AB - As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an effective implementation scheme is still lacking. This research provides a monitoring method, termed the dynamic T1 chart that improves the detection of assignable causes in feedback-controlled processes.
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U2 - 10.1080/07408170208928933
DO - 10.1080/07408170208928933
M3 - Article
AN - SCOPUS:0242297011
SN - 0740-817X
VL - 34
SP - 1043
EP - 1053
JO - IIE Transactions (Institute of Industrial Engineers)
JF - IIE Transactions (Institute of Industrial Engineers)
IS - 12
ER -