As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an effective implementation scheme is still lacking. This research provides a monitoring method, termed the dynamic T1 chart that improves the detection of assignable causes in feedback-controlled processes.
|Original language||English (US)|
|Number of pages||11|
|Journal||IIE Transactions (Institute of Industrial Engineers)|
|State||Published - Dec 2002|
ASJC Scopus subject areas
- Industrial and Manufacturing Engineering