The Dynamics of Thin Films I: General Theory

M. P. Ida; M. J. Miksis

doi:10.1137/s0036139995289556

The Dynamics of Thin Films I: General Theory

M. P. Ida^*, M. J. Miksis

^*Corresponding author for this work

Engineering Sciences and Applied Mathematics

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The dynamics of a general three-dimensional thin film subject to van der Waals forces, surface tension, and surfactants is considered. Using an asymptotic analysis based upon the thinness of the film with respect to its lateral extent, evolution equations for the leading-order film thicknesses, tangential velocities, and surfactant concentrations are obtained.

Original language	English (US)
Pages (from-to)	456-473
Number of pages	18
Journal	SIAM Journal on Applied Mathematics
Volume	58
Issue number	2
DOIs	https://doi.org/10.1137/s0036139995289556
State	Published - 1998

Keywords

Lamella
Matched asymptotic expansion
Stability

ASJC Scopus subject areas

Applied Mathematics

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10.1137/s0036139995289556

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title = "The Dynamics of Thin Films I: General Theory",

abstract = "The dynamics of a general three-dimensional thin film subject to van der Waals forces, surface tension, and surfactants is considered. Using an asymptotic analysis based upon the thinness of the film with respect to its lateral extent, evolution equations for the leading-order film thicknesses, tangential velocities, and surfactant concentrations are obtained.",

keywords = "Lamella, Matched asymptotic expansion, Stability",

author = "Ida, {M. P.} and Miksis, {M. J.}",

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AU - Miksis, M. J.

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N2 - The dynamics of a general three-dimensional thin film subject to van der Waals forces, surface tension, and surfactants is considered. Using an asymptotic analysis based upon the thinness of the film with respect to its lateral extent, evolution equations for the leading-order film thicknesses, tangential velocities, and surfactant concentrations are obtained.

AB - The dynamics of a general three-dimensional thin film subject to van der Waals forces, surface tension, and surfactants is considered. Using an asymptotic analysis based upon the thinness of the film with respect to its lateral extent, evolution equations for the leading-order film thicknesses, tangential velocities, and surfactant concentrations are obtained.

KW - Lamella

KW - Matched asymptotic expansion

KW - Stability

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M3 - Article

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JF - SIAM Journal on Applied Mathematics

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ER -

The Dynamics of Thin Films I: General Theory

Abstract

Keywords

ASJC Scopus subject areas

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