Abstract
We have derived an expression for the structure factor of a superlattice with "rough" interfaces, i.e., with random variations in the thicknesses of the layers. Our expression allows the determination of x-ray diffraction profiles in both radial (θ-2θ) and rocking scans. We have shown that the rocking curve of the central peak is essentially unaffected by this kind of disorder; and we have calculated the rocking curve widths of the satellites as a function of roughness. The implications of our model for the use of satellite/central peak intensity ratios as a measure of superlattice perfection are discussed.
Original language | English (US) |
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Pages (from-to) | 1504-1507 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 59 |
Issue number | 5 |
DOIs | |
State | Published - 1986 |
ASJC Scopus subject areas
- General Physics and Astronomy