Changes in the microstructure and magnetic domain structure of sputtered Fe/Cr multilayers were recorded during in situ heating in an electron microscope. The films showed different behaviour for different Cr spacer layer thicknesses. Three-dimensional chemical information from position sensitive atom probe microanalysis showed improved Fe/Cr interface smoothness after annealing.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics