The effects of annealing on magnetic domain structure and interface profile in sputtered Fe/Cr multilayer films

Amanda K. Petford-Long*, R. C. Doole, A. Cerezo, J. S. Conyers, J. P. Jakubovics

*Corresponding author for this work

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

Changes in the microstructure and magnetic domain structure of sputtered Fe/Cr multilayers were recorded during in situ heating in an electron microscope. The films showed different behaviour for different Cr spacer layer thicknesses. Three-dimensional chemical information from position sensitive atom probe microanalysis showed improved Fe/Cr interface smoothness after annealing.

Original languageEnglish (US)
Pages (from-to)117-120
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Volume126
Issue number1-3
DOIs
StatePublished - Sep 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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