The effects of stress on the defect and electronic properties of mixed ionic electronic conductors

O. Comets*, P. W. Voorhees

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Understanding the effect of stress on the properties of oxides used in a solid oxide fuel cell (SOFC) is crucial for predicting its performance. The stress can come from many sources, such as compositional strain or thermal expansion mismatch between various constituents of the cell. These two effects can combine and alter the electronic structure as well as the defect chemistry of the oxide. In this paper, the effects of stress on the electron hole and oxygen vacancy concentrations and conductivities are addressed in mixed ionic electronic conductors (MIECs) in equilibrium with oxygen. Furthermore, two types of mixed conducting oxides are examined, and treated with the same formalism to illuminate the effects of stress on these materials. Applications of this model include SOFCs and thin films.

Original languageEnglish (US)
Title of host publicationSolid Oxide Fuel Cells 12, SOFC XII
Pages2105-2111
Number of pages7
Edition3 PART 3
DOIs
StatePublished - Dec 1 2011
Event12th International Symposium on Solid Oxide Fuel Cells, SOFC-XII - 219th ECS Meeting - Montreal, QC, Canada
Duration: May 1 2011May 6 2011

Publication series

NameECS Transactions
Number3 PART 3
Volume35
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

Other12th International Symposium on Solid Oxide Fuel Cells, SOFC-XII - 219th ECS Meeting
CountryCanada
CityMontreal, QC
Period5/1/115/6/11

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Comets, O., & Voorhees, P. W. (2011). The effects of stress on the defect and electronic properties of mixed ionic electronic conductors. In Solid Oxide Fuel Cells 12, SOFC XII (3 PART 3 ed., pp. 2105-2111). (ECS Transactions; Vol. 35, No. 3 PART 3). https://doi.org/10.1149/1.3570201