The formation, transport properties and microstructure of 45° [001] grain boundaries induced by epitaxy modification in YBa2Cu3O7-x thin films

B. V. Vuchic, K. L. Merkle*, P. M. Baldo, K. A. Dean, D. B. Buchholz, R. P.H. Chang, H. Zhang, L. D. Marks

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Material Science