The intensity of elastic and inelastic multiple scattering in EELS

S. C. Cheng; Y. Y. Wang; V. P. Dravid

doi:10.1016/0968-4328(96)00024-8

The intensity of elastic and inelastic multiple scattering in EELS

S. C. Cheng^*, Y. Y. Wang, V. P. Dravid

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

To evaluate the contribution of multiple scattering in momentum-resolved electron energy-loss spectroscopy, the angular dependence of the intensities of multiple scattering was investigated and compared with elastic and inelastic single-scattering profiles. From the experimental data the intensity ratio between multiple scattering and elastic scattering is derived. It can be used to estimate the contribution of multiply-scattered electrons in normal experimental conditions.

Original language	English (US)
Pages (from-to)	167-170
Number of pages	4
Journal	Micron
Volume	27
Issue number	2
DOIs	https://doi.org/10.1016/0968-4328(96)00024-8
State	Published - Apr 1996

Keywords

EELS
Elastic scattering
electron energy loss spectroscopy
inelastic scattering
mean free path
multiple scattering

ASJC Scopus subject areas

Structural Biology
Materials Science(all)
Physics and Astronomy(all)
Cell Biology

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10.1016/0968-4328(96)00024-8

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title = "The intensity of elastic and inelastic multiple scattering in EELS",

abstract = "To evaluate the contribution of multiple scattering in momentum-resolved electron energy-loss spectroscopy, the angular dependence of the intensities of multiple scattering was investigated and compared with elastic and inelastic single-scattering profiles. From the experimental data the intensity ratio between multiple scattering and elastic scattering is derived. It can be used to estimate the contribution of multiply-scattered electrons in normal experimental conditions.",

keywords = "EELS, Elastic scattering, electron energy loss spectroscopy, inelastic scattering, mean free path, multiple scattering",

author = "Cheng, {S. C.} and Wang, {Y. Y.} and Dravid, {V. P.}",

note = "Funding Information: research is supported by the NSF grant the Science and Technology Center for",

year = "1996",

month = apr,

doi = "10.1016/0968-4328(96)00024-8",

language = "English (US)",

volume = "27",

pages = "167--170",

journal = "Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik",

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TY - JOUR

T1 - The intensity of elastic and inelastic multiple scattering in EELS

AU - Cheng, S. C.

AU - Wang, Y. Y.

AU - Dravid, V. P.

N1 - Funding Information: research is supported by the NSF grant the Science and Technology Center for

PY - 1996/4

Y1 - 1996/4

N2 - To evaluate the contribution of multiple scattering in momentum-resolved electron energy-loss spectroscopy, the angular dependence of the intensities of multiple scattering was investigated and compared with elastic and inelastic single-scattering profiles. From the experimental data the intensity ratio between multiple scattering and elastic scattering is derived. It can be used to estimate the contribution of multiply-scattered electrons in normal experimental conditions.

AB - To evaluate the contribution of multiple scattering in momentum-resolved electron energy-loss spectroscopy, the angular dependence of the intensities of multiple scattering was investigated and compared with elastic and inelastic single-scattering profiles. From the experimental data the intensity ratio between multiple scattering and elastic scattering is derived. It can be used to estimate the contribution of multiply-scattered electrons in normal experimental conditions.

KW - EELS

KW - Elastic scattering

KW - electron energy loss spectroscopy

KW - inelastic scattering

KW - mean free path

KW - multiple scattering

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U2 - 10.1016/0968-4328(96)00024-8

DO - 10.1016/0968-4328(96)00024-8

M3 - Article

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SN - 0968-4328

VL - 27

SP - 167

EP - 170

JO - Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik

JF - Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik

IS - 2

ER -

The intensity of elastic and inelastic multiple scattering in EELS

Abstract

Keywords

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