Abstract
An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 73-86 |
| Number of pages | 14 |
| Journal | Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties |
| Volume | 53 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1986 |
Funding
ACKNOWLEDGMENTS This work was part of the Ph.D. thesis of S. R. Stock (University of Illinois, 1983) and was supported by the Ofice of Naval Research through contract NOOO14-75-C-1012. One of the authors (S.R.S.) would also like to acknowledge support from a graduate fellowship provided by IBM. We would also like to acknowledge use of the facilities of the MRL Center for Microanalysis of Materials which is supported as a national facility by the Materials Sciences Division of the Department of Energy.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Materials Science
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)
- Metals and Alloys