The measurement of strain fields by X-ray topographic contour mapping

S. R. Stock; Haydn Chen; H. K. Birnbaum; S. R. Stock

doi:10.1080/01418618608242808

The measurement of strain fields by X-ray topographic contour mapping

S. R. Stock, Haydn Chen, H. K. Birnbaum, S. R. Stock

Cell & Developmental Biology

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12 Scopus citations

Abstract

An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.

Original language	English (US)
Pages (from-to)	73-86
Number of pages	14
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	53
Issue number	1
DOIs	https://doi.org/10.1080/01418618608242808
State	Published - Jan 1986

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Materials Science(all)
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

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10.1080/01418618608242808

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title = "The measurement of strain fields by X-ray topographic contour mapping",

abstract = "An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.",

author = "Stock, {S. R.} and Haydn Chen and Birnbaum, {H. K.} and Stock, {S. R.}",

note = "Funding Information: ACKNOWLEDGMENTS This work was part of the Ph.D. thesis of S. R. Stock (University of Illinois, 1983) and was supported by the Ofice of Naval Research through contract NOOO14-75-C-1012. One of the authors (S.R.S.) would also like to acknowledge support from a graduate fellowship provided by IBM. We would also like to acknowledge use of the facilities of the MRL Center for Microanalysis of Materials which is supported as a national facility by the Materials Sciences Division of the Department of Energy.",

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AB - An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.

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The measurement of strain fields by X-ray topographic contour mapping

Abstract

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