The measurement of strain fields by X-ray topographic contour mapping

S. R. Stock, Haydn Chen, H. K. Birnbaum, S. R. Stock

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

An X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed.

Original languageEnglish (US)
Pages (from-to)73-86
Number of pages14
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume53
Issue number1
DOIs
StatePublished - Jan 1986

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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