The pressure-viscosity coefficient for Newtonian EHL film thiickness with general piezoviscous response

Scott Bair*, Yuchuan Liu, Q Jane Wang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

There has been a long-standing need for a piezoviscous parameter, α film, that together with the ambient viscosity, μ 0, will completely quantify the Newtonian rheology so that the film thickness for liquids that do not shear-thin in the inlet may be calculated as h = h (μ 0, α film,...) regardless of the details of the pressure-viscosity response. It seems that Blok's reciprocal asymptotic isoviscous pressure, α*, has certain advantages over the conventional pressure-viscosity coefficient that is poorly suited for this purpose. The first detailed review of piezoviscous models for low pressures is provided. A simulation code that is apparently stable for all realistic pressure-viscosity response was utilized with diverse piezoviscous models and model liquids to develop a satisfactory definition of α film that reads α film = [1-exp(-3)]/[∫ 0 3/α* μ(0) dp/μ(p)]; 1/α*= ∫ 0 μ(0)dp/μ(p). In the case of μ = μ 0 exp(αp), α film = α and formulas are provided for other models.

Original languageEnglish (US)
Title of host publicationProceedings of STLE/ASME International Joint Tribology Conference, IJTC 2006
Volume2006
StatePublished - Nov 28 2006
EventSTLE/ASME International Joint Tribology Conference, IJTC 2006 - San Antonio, TX, United States
Duration: Oct 23 2006Oct 25 2006

Other

OtherSTLE/ASME International Joint Tribology Conference, IJTC 2006
CountryUnited States
CitySan Antonio, TX
Period10/23/0610/25/06

ASJC Scopus subject areas

  • Engineering(all)

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