The structural and magnetic characterisation of MBE-grown FEMN/NIFE exchange-biased bilayers

Young Suk Choi*, Amanda K. Petford-Long, Roger C C Ward, Mike R. Wells

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

The epitaxial growth of exchange biased ferromagnetic and antiferromagnetic films was reported and their magnetic properties were compared with those of sputtered samples. Thin films were grown in a magnetic field using molecular beam epitaxy. Chemical and thermal etching of the substrates was used to obtain epitaxial growth of the magnetic layers. The structural characterization was performed by reflection high-energy electron diffraction and high resolution electron microscopy.

Original languageEnglish (US)
JournalDigests of the Intermag Conference
StatePublished - Dec 1 2002
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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