The epitaxial growth of exchange biased ferromagnetic and antiferromagnetic films was reported and their magnetic properties were compared with those of sputtered samples. Thin films were grown in a magnetic field using molecular beam epitaxy. Chemical and thermal etching of the substrates was used to obtain epitaxial growth of the magnetic layers. The structural characterization was performed by reflection high-energy electron diffraction and high resolution electron microscopy.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - Dec 1 2002|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: Apr 28 2002 → May 2 2002
ASJC Scopus subject areas
- Electrical and Electronic Engineering