The structural and magnetic characterisation of MBE-grown FeMn/NiFe exchange-biased bilayers

Young Suk Choi; Amanda K. Petford-Long; Roger C C Ward; Mike R. Wells

doi:10.1109/INTMAG.2002.1000607

The structural and magnetic characterisation of MBE-grown FeMn/NiFe exchange-biased bilayers

Young Suk Choi, Amanda K. Petford-Long, Roger C C Ward, Mike R. Wells

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The exchange biasing which results from magnetic exchange interactions at the interface between a ferromagnetic (FM) and an antiferromagnetic (AFM) material has attracted much attention because of its enormous application possibilities, most of which have been restricted to polycrystalline materials. In the present study, we report the epitaxial growth of exchange biased FM/AFM films and compare the magnetic properties with those of sputtered samples. Thin films of Si[111]/Cu 2nm/NiFe 6nm/FeMn (8, 10, 12)nm/Cu 2nm were grown in a magnetic field of about 200 Oe using molecular beam epitaxy (MBE). Chemical and thermal etching of the substrate, as well as insertion of a Cu buffer layer, were used to obtain epitaxial growth of the magnetic layers. The structural characterisation was performed by reflection high-energy electron diffraction (RHEED) and high resolution electron microscopy (HREM), and the magnetic properties were measured by vibrating sample magnetometry (VSM).

Original language	English (US)
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1000607
State	Published - Jan 1 2002
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: Apr 28 2002 → May 2 2002

Other

Other	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	4/28/02 → 5/2/02

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering
Surfaces, Coatings and Films

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10.1109/INTMAG.2002.1000607

Cite this

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title = "The structural and magnetic characterisation of MBE-grown FeMn/NiFe exchange-biased bilayers",

abstract = "The exchange biasing which results from magnetic exchange interactions at the interface between a ferromagnetic (FM) and an antiferromagnetic (AFM) material has attracted much attention because of its enormous application possibilities, most of which have been restricted to polycrystalline materials. In the present study, we report the epitaxial growth of exchange biased FM/AFM films and compare the magnetic properties with those of sputtered samples. Thin films of Si[111]/Cu 2nm/NiFe 6nm/FeMn (8, 10, 12)nm/Cu 2nm were grown in a magnetic field of about 200 Oe using molecular beam epitaxy (MBE). Chemical and thermal etching of the substrate, as well as insertion of a Cu buffer layer, were used to obtain epitaxial growth of the magnetic layers. The structural characterisation was performed by reflection high-energy electron diffraction (RHEED) and high resolution electron microscopy (HREM), and the magnetic properties were measured by vibrating sample magnetometry (VSM).",

author = "Choi, {Young Suk} and Petford-Long, {Amanda K.} and Ward, {Roger C C} and Wells, {Mike R.}",

year = "2002",

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booktitle = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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note = "2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 ; Conference date: 28-04-2002 Through 02-05-2002",

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Choi, YS, Petford-Long, AK, Ward, RCC & Wells, MR 2002, The structural and magnetic characterisation of MBE-grown FeMn/NiFe exchange-biased bilayers. in INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1000607, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 4/28/02. https://doi.org/10.1109/INTMAG.2002.1000607

The structural and magnetic characterisation of MBE-grown FeMn/NiFe exchange-biased bilayers. / Choi, Young Suk; Petford-Long, Amanda K.; Ward, Roger C C et al.
INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc., 2002. 1000607.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - The exchange biasing which results from magnetic exchange interactions at the interface between a ferromagnetic (FM) and an antiferromagnetic (AFM) material has attracted much attention because of its enormous application possibilities, most of which have been restricted to polycrystalline materials. In the present study, we report the epitaxial growth of exchange biased FM/AFM films and compare the magnetic properties with those of sputtered samples. Thin films of Si[111]/Cu 2nm/NiFe 6nm/FeMn (8, 10, 12)nm/Cu 2nm were grown in a magnetic field of about 200 Oe using molecular beam epitaxy (MBE). Chemical and thermal etching of the substrate, as well as insertion of a Cu buffer layer, were used to obtain epitaxial growth of the magnetic layers. The structural characterisation was performed by reflection high-energy electron diffraction (RHEED) and high resolution electron microscopy (HREM), and the magnetic properties were measured by vibrating sample magnetometry (VSM).

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The structural and magnetic characterisation of MBE-grown FeMn/NiFe exchange-biased bilayers

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