TY - JOUR
T1 - The structural and magnetic characterization of molecular-beam-epitaxy-grown FeMn-NiFe exchange-biased bilayers
AU - Choi, Young Suk
AU - Petford-Long, Amanda K.
AU - Ward, Roger C C
N1 - Funding Information:
Manuscript received February 12, 2002; revised May 22, 2002. This work was supported by the U.K. Engineering and Physical Science Research Council. Y. S. Choi and A. K. Petford-Long are with the Department of Materials, University of Oxford, OX1 3PH, U.K. (e-mail: young-suk.choi@materials. ox.ac.uk; amanda.petford-long@materials.oxford.ac.uk). R. C. C. Ward is with the Clarendon Laboratory, Department of Physics, University of Oxford, OX1 3PU, U.K. (e-mail: roger.ward@physics.ox.ac.uk). Digital Object Identifier 10.1109/TMAG.2002.802856.
PY - 2002/9
Y1 - 2002/9
N2 - Structural and magnetic characterizations have been performed on NiFe-FeMn exchange-biased bilayers grown by molecular beam epitaxy. The growth of the films showed high-quality epitaxy with well-defined flat interface between the layers. Magnetic measurements confirmed that the films showed not only a comparable exchange anisotropy field (Hex) to that of sputtered films but also a lowered threshold thickness of 2 nm at which Hex vanishes for the FeMn.
AB - Structural and magnetic characterizations have been performed on NiFe-FeMn exchange-biased bilayers grown by molecular beam epitaxy. The growth of the films showed high-quality epitaxy with well-defined flat interface between the layers. Magnetic measurements confirmed that the films showed not only a comparable exchange anisotropy field (Hex) to that of sputtered films but also a lowered threshold thickness of 2 nm at which Hex vanishes for the FeMn.
KW - Exchange anisotropy
KW - Magnetic characterization
KW - Molecular beam epitaxy
KW - Structural characterization
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U2 - 10.1109/TMAG.2002.802856
DO - 10.1109/TMAG.2002.802856
M3 - Conference article
AN - SCOPUS:0036761677
SN - 0018-9464
VL - 38
SP - 2758
EP - 2760
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 5 I
T2 - 2002 International Magnetics Conference (Intermag 2002)
Y2 - 28 April 2002 through 2 May 2002
ER -