The structural and magnetic characterization of molecular-beam-epitaxy-grown FeMn-NiFe exchange-biased bilayers

Young Suk Choi*, Amanda K. Petford-Long, Roger C C Ward

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations

Abstract

Structural and magnetic characterizations have been performed on NiFe-FeMn exchange-biased bilayers grown by molecular beam epitaxy. The growth of the films showed high-quality epitaxy with well-defined flat interface between the layers. Magnetic measurements confirmed that the films showed not only a comparable exchange anisotropy field (Hex) to that of sputtered films but also a lowered threshold thickness of 2 nm at which Hex vanishes for the FeMn.

Original languageEnglish (US)
Pages (from-to)2758-2760
Number of pages3
JournalIEEE Transactions on Magnetics
Volume38
Issue number5 I
DOIs
StatePublished - Sep 1 2002
Event2002 International Magnetics Conference (Intermag 2002) - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

Keywords

  • Exchange anisotropy
  • Magnetic characterization
  • Molecular beam epitaxy
  • Structural characterization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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