The three-dimensional microstructure of materials: Measurement and analysis

D. Kammer*, R. Mendoza, Scott A Barnett, Peter W Voorhees

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations
Original languageEnglish (US)
Pages (from-to)72-73
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 25 2005

ASJC Scopus subject areas

  • Instrumentation

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