The use of high resolution electron microscopy and image simulation to determine the sharpness of InP/GaInAs interfaces in multiple quantum-well structures

Amanda K. Petford-Long*, G. R. Booker, M. Hockly

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'The use of high resolution electron microscopy and image simulation to determine the sharpness of InP/GaInAs interfaces in multiple quantum-well structures'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds