Abstract
The impact of electric field on the atomic layer epitaxy of ZnO on α-Al2O3 surface was studied. The polarization orientation and the polarization forces were the two effects that influenced the epitaxial growth. Experimental results indicated that electric field could make growth difference for the ZnO films with this method.
Original language | English (US) |
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Pages (from-to) | 8139-8143 |
Number of pages | 5 |
Journal | Journal of Chemical Physics |
Volume | 116 |
Issue number | 18 |
DOIs | |
State | Published - May 8 2002 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry