Abstract
A reasonably detailed analysis of the effects of charge redistribution on both X-ray and electron structure factors as well as for high-resolution electron-microscope images are presented for a series of light-element oxides. The charge redistribution leads to differences of 2-3% for the X-ray structure factors and 5-7% for electron structure factors in the 0-0.5 Å-1 region. There are detectable changes in images of about 10% of the contrast, somewhat dependent upon the alignment of atom columns, specimen thickness and defocus. These studies suggest that charge redistribution may be detectable using a Cc-limited aberration-corrected microscope with a specimen thickness of about 50 Å.
Original language | English (US) |
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Pages (from-to) | 208-216 |
Number of pages | 9 |
Journal | Acta Crystallographica Section A: Foundations of Crystallography |
Volume | 62 |
Issue number | 3 |
DOIs | |
State | Published - May 2006 |
ASJC Scopus subject areas
- Structural Biology