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Theoretical structure factors for selected oxides and their effects in high-resolution electron-microscope (HREM) images
B. Deng, L. D. Marks
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Materials Science and Engineering
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peer-review
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Scopus citations
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INIS
alignment
25%
atoms
25%
charges
75%
electron microscopes
50%
electronic structure
50%
images
75%
microscopes
25%
oxides
50%
resolution
50%
structure factors
100%
thickness
50%
x radiation
50%
Earth and Planetary Sciences
Aberration
25%
Alignment
25%
Atom
25%
Contrast
25%
Difference
25%
High Resolution
50%
Image
75%
Investigation
25%
Light Element
25%
Microscope
25%
Oxide
50%
Specimen
50%
Thickness
50%
X Ray
50%
Chemistry
Analytical Method
25%
Atom
25%
Column Like Crystal
25%
Oxide
50%
Structure Factor
100%
Thickness
50%
X-Ray
50%
Biochemistry, Genetics and Molecular Biology
Atom
25%
Contrast
25%
Electron
50%
Light
25%
Thickness
50%
X Ray
50%
Material Science
Electronic Structure
50%