Thermal activation from the fluxoid and the voltage states of dc SQUIDs

E. Ben-Jacob; D. J. Bergman; Y. Imry; B. J. Matkowsky; Z. Schuss

doi:10.1063/1.331885

Thermal activation from the fluxoid and the voltage states of dc SQUIDs

E. Ben-Jacob^*, D. J. Bergman, Y. Imry, B. J. Matkowsky, Z. Schuss

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Abstract

The probability density of thermal fluctuations about different types of nonequilibrium steady states of a dc SQUID are evaluated by generalizing a technique used before for the fluctuations of a single Josephson junction. Probability densities obtained for both "running" and "beating" modes are used to calculate thermal activation rates as well as the various branches of the I-V characteristic. The results are compared with the experiments of Voss et al. and good agreement is found.

Original language	English (US)
Pages (from-to)	6533-6542
Number of pages	10
Journal	Journal of Applied Physics
Volume	54
Issue number	11
DOIs	https://doi.org/10.1063/1.331885
State	Published - 1983
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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abstract = "The probability density of thermal fluctuations about different types of nonequilibrium steady states of a dc SQUID are evaluated by generalizing a technique used before for the fluctuations of a single Josephson junction. Probability densities obtained for both {"}running{"} and {"}beating{"} modes are used to calculate thermal activation rates as well as the various branches of the I-V characteristic. The results are compared with the experiments of Voss et al. and good agreement is found.",

author = "E. Ben-Jacob and Bergman, {D. J.} and Y. Imry and Matkowsky, {B. J.} and Z. Schuss",

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T1 - Thermal activation from the fluxoid and the voltage states of dc SQUIDs

AU - Ben-Jacob, E.

AU - Bergman, D. J.

AU - Imry, Y.

AU - Matkowsky, B. J.

AU - Schuss, Z.

PY - 1983

Y1 - 1983

N2 - The probability density of thermal fluctuations about different types of nonequilibrium steady states of a dc SQUID are evaluated by generalizing a technique used before for the fluctuations of a single Josephson junction. Probability densities obtained for both "running" and "beating" modes are used to calculate thermal activation rates as well as the various branches of the I-V characteristic. The results are compared with the experiments of Voss et al. and good agreement is found.

AB - The probability density of thermal fluctuations about different types of nonequilibrium steady states of a dc SQUID are evaluated by generalizing a technique used before for the fluctuations of a single Josephson junction. Probability densities obtained for both "running" and "beating" modes are used to calculate thermal activation rates as well as the various branches of the I-V characteristic. The results are compared with the experiments of Voss et al. and good agreement is found.

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Thermal activation from the fluxoid and the voltage states of dc SQUIDs

Abstract

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