Thermal activation from the fluxoid and the voltage states of dc SQUIDs

E. Ben-Jacob*, D. J. Bergman, Y. Imry, Bernard J Matkowsky, Z. Schuss

*Corresponding author for this work

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35 Scopus citations

Abstract

The probability density of thermal fluctuations about different types of nonequilibrium steady states of a dc SQUID are evaluated by generalizing a technique used before for the fluctuations of a single Josephson junction. Probability densities obtained for both "running" and "beating" modes are used to calculate thermal activation rates as well as the various branches of the I-V characteristic. The results are compared with the experiments of Voss et al. and good agreement is found.

Original languageEnglish (US)
Pages (from-to)6533-6542
Number of pages10
JournalJournal of Applied Physics
Volume54
Issue number11
DOIs
StatePublished - Dec 1 1983

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Ben-Jacob, E., Bergman, D. J., Imry, Y., Matkowsky, B. J., & Schuss, Z. (1983). Thermal activation from the fluxoid and the voltage states of dc SQUIDs. Journal of Applied Physics, 54(11), 6533-6542. https://doi.org/10.1063/1.331885