Thermal diffusivity measurement of YBa2Cu3O7-x thin film with a picosecond thermoreflectance technique

Y. Y. Kim, H. A. Alwi, Q. Huang, R. Abd-Shukor, C. F. Tsai, H. Wang, K. W. Kim, D. G. Naugle, Sridhar Krishnaswamy*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The thermal diffusivity of YBa2Cu3O7-x (YBCO) film was measured using the optical pump-probe method. A theoretical finite-difference model was employed to calculate the diffusivity value, and the best fit for the c-axis oriented YBCO film showed an average thermal diffusivity of 0.25 ± 0.05 mm2 s-1. The obtained result is compared to previous reports measured using various methods.

Original languageEnglish (US)
Pages (from-to)365-368
Number of pages4
JournalPhysica C: Superconductivity and its Applications
Volume470
Issue number7-8
DOIs
StatePublished - Apr 1 2010

Keywords

  • Thermal diffusivity
  • Thermoreflectance
  • Thin films
  • YBCO

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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