Abstract
A non-invasive, affordable and easy-to-maintain thermal imaging system capable of measuring devices under normal operating conditions is described. The system's operating principle is based on the application of near-field scanning optical microscopy (NSOM) to infrared (IR) thermography. Results of the preliminary test of the system performance are presented.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 249-250 |
| Number of pages | 2 |
| Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Volume | 1 |
| State | Published - Dec 1 1996 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering