Thermally Triggered Degradation of Transient Electronic Devices

Chan Woo Park; Seung Kyun Kang; Hector Lopez Hernandez; Joshua A. Kaitz; Dae Seung Wie; Jiho Shin; Olivia P. Lee; Nancy R. Sottos; Jeffrey S. Moore; John A. Rogers; Scott R. White

doi:10.1002/adma.201501180

Thermally Triggered Degradation of Transient Electronic Devices

Chan Woo Park, Seung Kyun Kang, Hector Lopez Hernandez, Joshua A. Kaitz, Dae Seung Wie, Jiho Shin, Olivia P. Lee, Nancy R. Sottos, Jeffrey S. Moore, John A. Rogers, Scott R. White^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

156 Scopus citations

Abstract

Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

Original language	English (US)
Pages (from-to)	3783-3788
Number of pages	6
Journal	Advanced Materials
Volume	27
Issue number	25
DOIs	https://doi.org/10.1002/adma.201501180
State	Published - Jul 1 2015

Keywords

heat triggers
remote triggering
transient electronics
triggered degradation
wax encapsulation

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
General Materials Science

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10.1002/adma.201501180

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@article{fd37e748b12c4fd688dff21b03955350,

title = "Thermally Triggered Degradation of Transient Electronic Devices",

abstract = "Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.",

keywords = "heat triggers, remote triggering, transient electronics, triggered degradation, wax encapsulation",

author = "Park, {Chan Woo} and Kang, {Seung Kyun} and Hernandez, {Hector Lopez} and Kaitz, {Joshua A.} and Wie, {Dae Seung} and Jiho Shin and Lee, {Olivia P.} and Sottos, {Nancy R.} and Moore, {Jeffrey S.} and Rogers, {John A.} and White, {Scott R.}",

note = "Publisher Copyright: {\textcopyright} 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.",

year = "2015",

month = jul,

day = "1",

doi = "10.1002/adma.201501180",

language = "English (US)",

volume = "27",

pages = "3783--3788",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-VCH Verlag",

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T1 - Thermally Triggered Degradation of Transient Electronic Devices

AU - Park, Chan Woo

AU - Kang, Seung Kyun

AU - Hernandez, Hector Lopez

AU - Kaitz, Joshua A.

AU - Wie, Dae Seung

AU - Shin, Jiho

AU - Lee, Olivia P.

AU - Sottos, Nancy R.

AU - Moore, Jeffrey S.

AU - Rogers, John A.

AU - White, Scott R.

PY - 2015/7/1

Y1 - 2015/7/1

N2 - Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

AB - Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

KW - heat triggers

KW - remote triggering

KW - transient electronics

KW - triggered degradation

KW - wax encapsulation

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U2 - 10.1002/adma.201501180

DO - 10.1002/adma.201501180

M3 - Article

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AN - SCOPUS:84934299078

SN - 0935-9648

VL - 27

SP - 3783

EP - 3788

JO - Advanced Materials

JF - Advanced Materials

IS - 25

ER -

Thermally Triggered Degradation of Transient Electronic Devices

Abstract

Keywords

ASJC Scopus subject areas

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