Thermoelectric and structural properties of Bi 1-x Te 1+x thin films on CdTe(111)

Yunki Kim*, Sunglae Cho, Antonio DiVenere, George K. Wong, Jerry R. Meyer, John B Ketterson

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


Thin films of the hexagonal phase of Bi 1-x Te 1+x have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi 1-x Te 1+x is an appropriate model system to study the dependencies of thermoelectric and structural properties on binary composition.

Original languageEnglish (US)
Pages (from-to)177-181
Number of pages5
JournalMaterials Research Society Symposium - Proceedings
StatePublished - Jan 1 1999
EventProceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA
Duration: Nov 30 1998Dec 3 1998

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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