TY - JOUR
T1 - Thermoelectric properties of the incommensurate layered semiconductor GexNbTe2
AU - Snyder, G. Jeffrey
AU - Caillat, T.
AU - Fleurial, J. P.
PY - 1999/12/1
Y1 - 1999/12/1
N2 - The compounds GexNbTe2 (0.39≤x≤0.53) have been studied for their thermoelectric properties. By changing x, the carrier concentration can be adjusted so that the material changes from a p-type metal to a p-type semiconductor. The maximum germanium concentration at about Ge0.5NbTe2, is also the most semiconducting composition. High and low temperature electrical resistivity, Hall effect, Seebeck coefficient, and thermal conductivity were measured. The thermal conductivity is reasonably low and glass-like with room temperature values around 20-25 mW/cm K. However, the power factor is too low to compete with state of the art materials. The maximum ZT found in these compounds is about 0.12. The low ZT can be traced to the low carrier mobility of about 10 cm2/Vs. The related compounds Si0.5NbTe2 and Ge0.5TaTe2 were also studied.
AB - The compounds GexNbTe2 (0.39≤x≤0.53) have been studied for their thermoelectric properties. By changing x, the carrier concentration can be adjusted so that the material changes from a p-type metal to a p-type semiconductor. The maximum germanium concentration at about Ge0.5NbTe2, is also the most semiconducting composition. High and low temperature electrical resistivity, Hall effect, Seebeck coefficient, and thermal conductivity were measured. The thermal conductivity is reasonably low and glass-like with room temperature values around 20-25 mW/cm K. However, the power factor is too low to compete with state of the art materials. The maximum ZT found in these compounds is about 0.12. The low ZT can be traced to the low carrier mobility of about 10 cm2/Vs. The related compounds Si0.5NbTe2 and Ge0.5TaTe2 were also studied.
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M3 - Article
AN - SCOPUS:0033299603
SN - 1094-2734
SP - 541
EP - 545
JO - International Conference on Thermoelectrics, ICT, Proceedings
JF - International Conference on Thermoelectrics, ICT, Proceedings
ER -