Thermomechanical modeling of scanning joule expansion microscopy imaging of single-walled carbon nanotube devices

Jizhou Song*, Chaofeng Lu, Xu Xie, Yuhang Li, Yihui Zhang, Kyle L. Grosse, Simon Dunham, Yonggang Huang, William P. King, John A. Rogers

*Corresponding author for this work

Research output: Contribution to journalArticle

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Abstract

An analytical model, validated by experiments and finite element simulations, is developed to study the thermal imaging of single-walled carbon nanotube (SWNT) devices by scanning Joule expansion microscopy (SJEM). A simple scaling law for thermal expansion at low frequencies, which only depends on two nondimensional geometric parameters, is established. Such a scaling law provides a simple way to determine the surface temperature distribution and power dissipation per unit length in an SWNT from the measured thermal expansion in experiments. The results suggest the spatial resolution of the SJEM measurement is as good as ∼50 nm.

Original languageEnglish (US)
Article number040907
JournalJournal of Applied Mechanics, Transactions ASME
Volume80
Issue number4
DOIs
StatePublished - Jul 2013

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Keywords

  • Scanning Joule expansion microscopy
  • Single-walled carbon nanotube
  • Thermal expansion

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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