Abstract
The growth during deposition and during post-deposition annealing of gold islands (40-80 Å in diameter) on glass substrates have been examined quantitatively and in situ with grazing incidence small angle X-ray scattering (GISAXS). The average island sizes and center-to-center island spacings have been determined as a function of gold coverage and annealing time and temperature. The annealing kinetics do not exhibit a power law dependence of average island size versus time. Instead, the data is best described by a soft-impingement, diffusion-limited, island-mobility-dominated growth model. This model yields a quantitative signature that growth is a result of island mobility. The activation energy and diffusion coefficient for the island mobility growth process are found to be of the same order of magnitude as values for single atom surface diffusion.
Original language | English (US) |
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Pages (from-to) | 215-224 |
Number of pages | 10 |
Journal | Surface Science |
Volume | 248 |
Issue number | 1-2 |
DOIs | |
State | Published - May 3 1991 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry