Three-dimensional atom probe studies of metallic multilayers

D. J. Larson*, A. K. Petford-Long, A. Cerezo, G. D W Smith

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

42 Scopus citations

Abstract

Multilayer film structures which exhibit giant magnetoresistance have applications in the areas of magnetic recording and computer memory. The magnetic properties of these structures are highly dependent upon atomic level structural and compositional variations. Thus, structural characterization with extremely high spatial resolution, especially at the interfaces, is very important in order to optimize the performance of these devices with respect to processing and operating conditions. Field-ion microscopy and three-dimensional atom probe microanalysis have been used to characterize the interfaces and grain boundaries in a structure containing 100 repetitions of a (Cu2 nm/Co2 nm) bilayer. Analyses show layer alloying, a high degree of layer curvature (particularly close to grain boundaries) and regions where cobalt layers are in contact. In addition, atomic scale analysis of the interface between copper and cobalt layers indicates that atomic planes are coherent from one layer to the next.

Original languageEnglish (US)
Pages (from-to)4019-4024
Number of pages6
JournalActa Materialia
Volume47
Issue number15
DOIs
StatePublished - Nov 1999
EventProceedings of the 1998 ACTA Materiala Workshop on 'Materials Science and Mechanics of Interfaces' - La Jolla, CA, USA
Duration: Oct 25 1998Oct 30 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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