Three-dimensional atom-probe tomographic studies of nickel monosilicide/silicon interfaces on a subnanometer scale

Praneet Adusumilli*, Conal E. Murray, Lincoln J. Lauhon, Ori Avayu, Yossi Rosenwaks, David N. Seidman

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

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Engineering & Materials Science