Three-dimensional atom-probe tomography: Advances and applications

David N. Seidman*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

340 Scopus citations

Abstract

This review presents the historical temporal evolution of an atomprobe tomograph (APT) from its genesis (1973) from field-ion microscope images of individual tungsten atoms (1955). The capabilities of modern APTs employing either electrical or laser pulsing are discussed. The results of the application of APTs to specific materials science problems are presented for research performed at North-western.University on the following problems: (a) the segregation of Mg at α-AI/Al3Sc heterophase interfaces, (b) phase decomposition in ternary Ni-Al-Cr and quaternary Ni-Al-Cr-Re alloys, and (c) 3-D nanoscale composition mapping of an InAs semiconductor nanowire whose growth was catalyzed by gold. These results demonstrate that it is now possible to obtain highly quantitative information from APT that can be compared with modeling, theory, simulations, and/or first-principles calculations.

Original languageEnglish (US)
Title of host publicationAnnual Review of Materials Research
EditorsDavid Clarke, Manfred Ruehle, Venkatraman Gopalan
Pages127-158
Number of pages32
DOIs
StatePublished - 2007

Publication series

NameAnnual Review of Materials Research
Volume37
ISSN (Print)1531-7331

Keywords

  • Field-ion microscopy
  • InAs nanowires
  • Laser-assisted LEAP™ tomography
  • Ni-Al-Cr alloys
  • Ni-Al-Cr-Re alloys
  • Time-of-flight mass spectrometry
  • α-Al/AlSc heterophase interfaces

ASJC Scopus subject areas

  • General Materials Science

Fingerprint

Dive into the research topics of 'Three-dimensional atom-probe tomography: Advances and applications'. Together they form a unique fingerprint.

Cite this