Three-dimensional atom-probe tomography

Advances and applications

David N Seidman*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

287 Citations (Scopus)

Abstract

This review presents the historical temporal evolution of an atomprobe tomograph (APT) from its genesis (1973) from field-ion microscope images of individual tungsten atoms (1955). The capabilities of modern APTs employing either electrical or laser pulsing are discussed. The results of the application of APTs to specific materials science problems are presented for research performed at North-western.University on the following problems: (a) the segregation of Mg at α-AI/Al3Sc heterophase interfaces, (b) phase decomposition in ternary Ni-Al-Cr and quaternary Ni-Al-Cr-Re alloys, and (c) 3-D nanoscale composition mapping of an InAs semiconductor nanowire whose growth was catalyzed by gold. These results demonstrate that it is now possible to obtain highly quantitative information from APT that can be compared with modeling, theory, simulations, and/or first-principles calculations.

Original languageEnglish (US)
Title of host publicationAnnual Review of Materials Research
EditorsDavid Clarke, Manfred Ruehle, Venkatraman Gopalan
Pages127-158
Number of pages32
DOIs
StatePublished - Oct 4 2007

Publication series

NameAnnual Review of Materials Research
Volume37
ISSN (Print)1531-7331

Fingerprint

Ion microscopes
Materials science
Nanowires
Tomography
Tungsten
Gold
Semiconductor materials
Decomposition
Atoms
Lasers
Chemical analysis
APT
indium arsenide

Keywords

  • Field-ion microscopy
  • InAs nanowires
  • Laser-assisted LEAP™ tomography
  • Ni-Al-Cr alloys
  • Ni-Al-Cr-Re alloys
  • Time-of-flight mass spectrometry
  • α-Al/AlSc heterophase interfaces

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Seidman, D. N. (2007). Three-dimensional atom-probe tomography: Advances and applications. In D. Clarke, M. Ruehle, & V. Gopalan (Eds.), Annual Review of Materials Research (pp. 127-158). (Annual Review of Materials Research; Vol. 37). https://doi.org/10.1146/annurev.matsci.37.052506.084200
Seidman, David N. / Three-dimensional atom-probe tomography : Advances and applications. Annual Review of Materials Research. editor / David Clarke ; Manfred Ruehle ; Venkatraman Gopalan. 2007. pp. 127-158 (Annual Review of Materials Research).
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Seidman, DN 2007, Three-dimensional atom-probe tomography: Advances and applications. in D Clarke, M Ruehle & V Gopalan (eds), Annual Review of Materials Research. Annual Review of Materials Research, vol. 37, pp. 127-158. https://doi.org/10.1146/annurev.matsci.37.052506.084200

Three-dimensional atom-probe tomography : Advances and applications. / Seidman, David N.

Annual Review of Materials Research. ed. / David Clarke; Manfred Ruehle; Venkatraman Gopalan. 2007. p. 127-158 (Annual Review of Materials Research; Vol. 37).

Research output: Chapter in Book/Report/Conference proceedingChapter

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Seidman DN. Three-dimensional atom-probe tomography: Advances and applications. In Clarke D, Ruehle M, Gopalan V, editors, Annual Review of Materials Research. 2007. p. 127-158. (Annual Review of Materials Research). https://doi.org/10.1146/annurev.matsci.37.052506.084200