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Three-dimensional atom-probe tomography: Advances and applications
David N. Seidman
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Corresponding author for this work
Materials Science and Engineering
Research output
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Chapter in Book/Report/Conference proceeding
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Chapter
322
Scopus citations
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atoms
100%
applications
100%
universities
50%
images
50%
lasers
50%
growth
50%
interfaces
50%
nanostructures
50%
probes
50%
information
50%
comparative evaluations
50%
alloys
50%
tomography
50%
simulation
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reviews
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modeling
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mapping
50%
semiconductor materials
50%
decomposition
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gold
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nanowires
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segregation
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genesis
50%
indium arsenides
50%
tungsten
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ion microscopes
50%
Physics
Utilization
100%
Decomposition
50%
Nanoscale
50%
Tomography
50%
Ion Microscopes
50%
Semiconductor
50%
Tungsten
50%
Atoms
50%
Growth
50%
Simulation
50%
Alloy
50%
Universities
50%
Information
50%
Laser
50%
Nanowires
50%
Chemistry
Application
100%
Attached Proton Test
100%
Decomposition
50%
Nanowire
50%
Semiconductor
50%
Tungsten
50%
First Principle
50%
Phase Composition
50%
Atom
50%
Alloy
50%
Simulation
50%
Segregation
50%
Computer Science
Application
100%
Specific Material
50%
Temporal Evolution
50%
Microscope Image
50%
Modeling
50%
Simulation
50%
Chemical Engineering
Artificial Intelligence
50%
Nanowires
50%
Tungsten
50%
Material Science
Atom Probe
50%
Semiconductor Material
50%
Materials Science
50%