Abstract
The three dimensional domain structure of barium titanate thin films was determined using a serial sectioning technique. The domain structure varied sharply through the film thickness, being primarily a-oriented near the substrate and increasingly c-oriented away from this interface. The variation in domain structure is explained in terms of a strain gradient due to partial relaxation of epitaxial coherency strains. The refractive index also varied through the film thickness. A simple relationship based on areal fraction of each domain type aptly described the changes in refractive index with domain structure. These results indicate the importance of understanding three-dimensional domain structure and its impact on film properties.
Original language | English (US) |
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Pages (from-to) | 89-93 |
Number of pages | 5 |
Journal | Journal of Electroceramics |
Volume | 13 |
Issue number | 1-3 |
DOIs | |
State | Published - Jul 2004 |
Keywords
- Domain
- Ferroelectric
- Thin film
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Mechanics of Materials
- Electrical and Electronic Engineering
- Materials Chemistry