Three-dimensional ferroelectric domain imaging of epitaxial BiFeO 3 thin films using angle-resolved piezoresponse force microscopy

Moonkyu Park, Seungbum Hong*, Jeffrey A. Klug, Michael J. Bedzyk, Orlando Auciello, Kwangsoo No, Amanda Petford-Long

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

48 Scopus citations

Abstract

Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30° increments around the surface normal vector and the in-plane PFM phase signals are collected at each angle. We obtained the AR-PFM images of BaTiO3 single crystal and cube-on-cube epitaxial (001) BiFeO3 (BFO) thin film on SrRuO3/ SrTiO3 substrate, and confirmed that the AR-PFM provides more unambiguous information on the in-plane polarization directions than the conventional PFM method. Moreover, we found eight additional in-plane polarization variants in epitaxial BFO thin films, which are formed to mitigate highly unstable charged domain boundaries.

Original languageEnglish (US)
Article number112907
JournalApplied Physics Letters
Volume97
Issue number11
DOIs
StatePublished - Sep 13 2010

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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