@article{cd1fa55fcbc0468b97d90d2c0cf11eb7,
title = "Three-dimensional ferroelectric domain imaging of epitaxial BiFeO 3 thin films using angle-resolved piezoresponse force microscopy",
abstract = "Here we introduce angle-resolved piezoresponse force microscopy (AR-PFM), whereby the sample is rotated by 30° increments around the surface normal vector and the in-plane PFM phase signals are collected at each angle. We obtained the AR-PFM images of BaTiO3 single crystal and cube-on-cube epitaxial (001) BiFeO3 (BFO) thin film on SrRuO3/ SrTiO3 substrate, and confirmed that the AR-PFM provides more unambiguous information on the in-plane polarization directions than the conventional PFM method. Moreover, we found eight additional in-plane polarization variants in epitaxial BFO thin films, which are formed to mitigate highly unstable charged domain boundaries.",
author = "Moonkyu Park and Seungbum Hong and Klug, {Jeffrey A.} and Bedzyk, {Michael J.} and Orlando Auciello and Kwangsoo No and Amanda Petford-Long",
note = "Funding Information: The submitted manuscript has been created by UChicago Argonne, LLC, Operator of Argonne National Laboratory (“Argonne”). Argonne, a U.S. Department of Energy Office of Science laboratory, is operated under Contract No. DE-AC02-06CH11357. The U. S. Government retains for itself, and others acting on its behalf, a paid-up nonexclusive, irrevocable worldwide license in said article to reproduce, prepare derivative works, distribute copies to the public, and perform publicly and display publicly, by or on behalf of the Government. The XRD facility at NU is supported by MRSEC Grant No. DMR-0520513 from the National Science Foundation. M.P. and K.N. acknowledge the financial support by Mid-career Researcher Program (Grant No. 2010-0015063) and Nano R&D Program (Grant No. 2009-0081946) through NRF grant funded by the MEST. We thank Professor A. Gruverman at University of Nebraska for his critical reading of our manuscript. ",
year = "2010",
month = sep,
day = "13",
doi = "10.1063/1.3487933",
language = "English (US)",
volume = "97",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "11",
}