Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

Jianwei Miao, Chien Chun Chen, M. C. Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R. White, Chin Yi Chiu, B. C. Regan, Yu Huang, Laurence D. Marks, Ulrich Dahmen

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1062-1063
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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Tomography
tomography
Imaging techniques
Defects
Electrons
defects
electrons

ASJC Scopus subject areas

  • Instrumentation

Cite this

Miao, Jianwei ; Chen, Chien Chun ; Scott, M. C. ; Ercius, Peter ; Zhu, Chun ; Mecklenburg, Matthew ; White, Edward R. ; Chiu, Chin Yi ; Regan, B. C. ; Huang, Yu ; Marks, Laurence D. ; Dahmen, Ulrich. / Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 1062-1063.
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title = "Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography",
author = "Jianwei Miao and Chen, {Chien Chun} and Scott, {M. C.} and Peter Ercius and Chun Zhu and Matthew Mecklenburg and White, {Edward R.} and Chiu, {Chin Yi} and Regan, {B. C.} and Yu Huang and Marks, {Laurence D.} and Ulrich Dahmen",
year = "2014",
month = "8",
day = "1",
doi = "10.1017/S143192761400703X",
language = "English (US)",
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Miao, J, Chen, CC, Scott, MC, Ercius, P, Zhu, C, Mecklenburg, M, White, ER, Chiu, CY, Regan, BC, Huang, Y, Marks, LD & Dahmen, U 2014, 'Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography', Microscopy and Microanalysis, vol. 20, no. 3, pp. 1062-1063. https://doi.org/10.1017/S143192761400703X

Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography. / Miao, Jianwei; Chen, Chien Chun; Scott, M. C.; Ercius, Peter; Zhu, Chun; Mecklenburg, Matthew; White, Edward R.; Chiu, Chin Yi; Regan, B. C.; Huang, Yu; Marks, Laurence D.; Dahmen, Ulrich.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1062-1063.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

AU - Miao, Jianwei

AU - Chen, Chien Chun

AU - Scott, M. C.

AU - Ercius, Peter

AU - Zhu, Chun

AU - Mecklenburg, Matthew

AU - White, Edward R.

AU - Chiu, Chin Yi

AU - Regan, B. C.

AU - Huang, Yu

AU - Marks, Laurence D.

AU - Dahmen, Ulrich

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U2 - 10.1017/S143192761400703X

DO - 10.1017/S143192761400703X

M3 - Conference article

AN - SCOPUS:84927921861

VL - 20

SP - 1062

EP - 1063

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -