Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

Jianwei Miao; Chien Chun Chen; M. C. Scott; Peter Ercius; Chun Zhu; Matthew Mecklenburg; Edward R. White; Chin Yi Chiu; B. C. Regan; Yu Huang; Laurence D. Marks; Ulrich Dahmen

doi:10.1017/S143192761400703X

Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

Jianwei Miao, Chien Chun Chen, M. C. Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R. White, Chin Yi Chiu, B. C. Regan, Yu Huang, Laurence D. Marks, Ulrich Dahmen

Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1062-1063
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S143192761400703X
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1017/S143192761400703X

Cite this

Miao, Jianwei ; Chen, Chien Chun ; Scott, M. C. ; Ercius, Peter ; Zhu, Chun ; Mecklenburg, Matthew ; White, Edward R. ; Chiu, Chin Yi ; Regan, B. C. ; Huang, Yu ; Marks, Laurence D. ; Dahmen, Ulrich. / Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 1062-1063.

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author = "Jianwei Miao and Chen, {Chien Chun} and Scott, {M. C.} and Peter Ercius and Chun Zhu and Matthew Mecklenburg and White, {Edward R.} and Chiu, {Chin Yi} and Regan, {B. C.} and Yu Huang and Marks, {Laurence D.} and Ulrich Dahmen",

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Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography. / Miao, Jianwei; Chen, Chien Chun; Scott, M. C.; Ercius, Peter; Zhu, Chun; Mecklenburg, Matthew; White, Edward R.; Chiu, Chin Yi; Regan, B. C.; Huang, Yu; Marks, Laurence D.; Dahmen, Ulrich.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1062-1063.

Research output: Contribution to journal › Conference article › peer-review

TY - JOUR

T1 - Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

AU - Miao, Jianwei

AU - Chen, Chien Chun

AU - Scott, M. C.

AU - Ercius, Peter

AU - Zhu, Chun

AU - Mecklenburg, Matthew

AU - White, Edward R.

AU - Chiu, Chin Yi

AU - Regan, B. C.

AU - Huang, Yu

AU - Marks, Laurence D.

AU - Dahmen, Ulrich

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JO - Microscopy and Microanalysis

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