@article{aa2396d73f554bff81f082ffda9c2774,
title = "Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography",
author = "Jianwei Miao and Chen, {Chien Chun} and Scott, {M. C.} and Peter Ercius and Chun Zhu and Matthew Mecklenburg and White, {Edward R.} and Chiu, {Chin Yi} and Regan, {B. C.} and Yu Huang and Marks, {Laurence D.} and Ulrich Dahmen",
note = "Copyright: Copyright 2015 Elsevier B.V., All rights reserved.; Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",
year = "2014",
month = aug,
day = "1",
doi = "10.1017/S143192761400703X",
language = "English (US)",
volume = "20",
pages = "1062--1063",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "3",
}