Three-dimensional imaging of dislocations and defects in materials at atomic resolution using electron tomography

Jianwei Miao, Chien Chun Chen, M. C. Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R. White, Chin Yi Chiu, B. C. Regan, Yu Huang, Laurence D. Marks, Ulrich Dahmen

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish (US)
Pages (from-to)1062-1063
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

ASJC Scopus subject areas

  • Instrumentation

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